File:A bibliography on methods for the measurement of inhomogeneities in semiconductors (1953-1967). (IA bibliographyonme445scha).pdf

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Original file ‎(1,091 × 1,500 pixels, file size: 2.05 MB, MIME type: application/pdf, 52 pages)

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A bibliography on methods for the measurement of inhomogeneities in semiconductors (1953-1967).   (Wikidata search (Cirrus search) Wikidata query (SPARQL)  Create new Wikidata item based on this file)
Author
Schafft, Harry A.; Needham, Susan Gayle
image of artwork listed in title parameter on this page
Title
A bibliography on methods for the measurement of inhomogeneities in semiconductors (1953-1967).
Volume NBS Technical Note 445
Description

About 130 papers which deal with the measurement techniques useful in detecting the type and location of various inhomogeneities, primarily in germanium and silicon, are listed with key words. The types of inhomogeneities considered are those in impurity


Subjects: Semiconductors--Bibliography.
Language English
Publication date 1968
publication_date QS:P577,+1968-00-00T00:00:00Z/9
Current location
IA Collections: NISTTechNotes; NISTresearchlibrary; fedlink; americana
Accession number
bibliographyonme445scha
Notes No copyright page found.
Source
Internet Archive identifier: bibliographyonme445scha
https://archive.org/download/bibliographyonme445scha/bibliographyonme445scha.pdf

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Public domain
This work is in the public domain in the United States because it is a work prepared by an officer or employee of the United States Government as part of that person’s official duties under the terms of Title 17, Chapter 1, Section 105 of the US Code. Note: This only applies to original works of the Federal Government and not to the work of any individual U.S. state, territory, commonwealth, county, municipality, or any other subdivision. This template also does not apply to postage stamp designs published by the United States Postal Service since 1978. (See § 313.6(C)(1) of Compendium of U.S. Copyright Office Practices). It also does not apply to certain US coins; see The US Mint Terms of Use.
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