File:Infrared spectrophotomete w66344588 0 th83m026b.tif

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English: Close-up view of a sample being inserted into a Perkin-Elmer Model 735 Infrared Spectrophotometer in use at a General Instrument Corporation laboratory in Hicksville, New York. Per notations accompanying the photograph, the instrument is being used to analyze the encapsulating materials used in the company's semiconductor products to ensure uniformity.
Date 1970s
date QS:P,+1970-00-00T00:00:00Z/8
Source https://digital.sciencehistory.org/works/w66344588
Author Perkin-Elmer Corporation

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current16:48, 24 February 2024Thumbnail for version as of 16:48, 24 February 20243,444 × 4,228, 2 pages (41.73 MB)Frypie (talk | contribs)Uploaded a work by Perkin-Elmer Corporation from https://digital.sciencehistory.org/works/w66344588 with UploadWizard

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