Category:Electron backscatter diffraction
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Method for material analysis. Backscattered electrons (BSEs) are produced by elastic collisions with atoms from the sample. BSEs produce an image that is related to material composition and orientation providing both spatial and chemical information.  | |||||
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Subcategories
This category has the following 3 subcategories, out of 3 total.
Media in category "Electron backscatter diffraction"
The following 23 files are in this category, out of 23 total.
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3D EBSD.jpg 984 × 713; 290 KB
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3D EBSD.tif 984 × 713; 900 KB
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Aged DSS EBSD (austenite removed).tif 829 × 680; 1.5 MB
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Aged DSS EBSD.png 919 × 790; 1.71 MB
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EBSD set-up.png 938 × 779; 1.05 MB
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EBSD setup graphic.png 375 × 281; 53 KB
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EBSD setup.jpg 860 × 720; 245 KB
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EBSD setup.tif 860 × 720; 932 KB
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Ebsd.jpg 479 × 479; 97 KB
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EBSD.png 484 × 348; 29 KB
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EBSD.svg 500 × 350; 15 KB
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EBSP indexed.jpg 312 × 640; 48 KB
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Indent Si.tif 1,276 × 636; 793 KB
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Overview of EBSD indexing procedure.jpg 593 × 510; 74 KB
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Sample after EBSD.jpg 376 × 275; 18 KB
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Transmission Kikuchi diffraction 2.jpg 1,272 × 418; 190 KB
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Transmission Kikuchi diffraction 2.tif 1,272 × 418; 579 KB
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Transmission Kikuchi diffraction.jpg 1,151 × 419; 237 KB
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Transmission Kikuchi diffraction.tif 1,151 × 419; 564 KB
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VFSD image of DSS 1.jpg 2,432 × 1,824; 2.7 MB
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VFSD image of DSS 2.jpg 2,024 × 1,518; 2.35 MB
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VFSD image of DSS 3.jpg 4,096 × 3,072; 2.26 MB
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VFSD image of DSS.jpg 2,815 × 1,948; 1.11 MB
