File:Figure 5. Shmoo plots with test period power supply test on a few FE-I4 devices.png
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Summary[edit]
| Description |
English: Qualifying devices in a test bed using Shmoo plots
Deutsch: Qualifizierung von Geräte in einer Test-Anordnung unter Verwendung von Shmoo Diagrammen. |
| Date | |
| Source |
https://iopscience.iop.org/article/10.1088/1748-0221/8/02/C02003/meta Journal of Instrumentation - The International School for Advanced Studies (SISSA) logo THE FOLLOWING ARTICLE IS OPEN ACCESS Production test engineering in FE-I4 system-on-chip to boost the reliability and high-quality demands in IBL applications V A Zivkovica and D Porretb Published 4 February 2013 • Journal of Instrumentation, Volume 8, February 2013 |
| Author |
To cite this article: V A Zivkovic and D Porret 2013 JINST 8 C02003 https://creativecommons.org/licenses/by/3.0/ You are free to:
for any purpose, even commercially. This license is acceptable for Free Cultural Works.The licensor cannot revoke these freedoms as long as you follow the license terms. |
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