File:Figure-4-Scanning-Electron-Microscopy-SEM-based-on-secondary-electron-detection-during-imaging-100m-wide-regions-of-the.gif
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| Description |
English: Figure 4 Scanning Electron Microscopy (SEM) based on secondary electron detection during imaging 100 μm wide regions of the as-received and the ground state of surfaces of SAE 1008/1010 steel. |
| Date | |
| Source | Kai Brune et. al. "Surface analytical approaches contributing to quality assurance during manufacture of functional interfaces", Applied Adhesion Science doi:10.1186/s40563-014-0030-0 |
| Author | Kai Brune, Christian Tornow, Michael Noeske, Thorben Wiesner, André Felipe Queiroz Barbosa, Stephani Stamboroski, Stefan Dieckhoff, Bernd Mayer |
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This is an Open Access article distributed under the terms of the Creative Commons Attribution License ( https://creativecommons.org/licenses/by/4.0 ), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 13:11, 3 March 2020 | | 567 × 247 (137 KB) | Sohmen (talk | contribs) | Uploaded by the NOA Upload Tool |
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