File:ESEMimages.jpg
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Summary[edit]
- Figure Caption: Two examples of images from an ESEM. Taken with a Philips XL-30 FEG. The first shows an electron beam deposited nanowire between two microelectrodes that has burnt after sustaining a high bias current. The other shows a multiwall carbon nanotube sample. Shorter working distances often improve image quality and so does a low beam current but it also increases the image acquisition time.
- Thanks to Haldor Topsøe A/S for ESEM time.
- This illustration was made for the Opensource Handbook of Nanoscience and Nanotechnology
- Please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration!
- The image also appears on the Commons/nanotechnology page
- Illustration by Kristian Molhave
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 20:58, 20 November 2006 | 945 × 319 (170 KB) | KristianMolhave (talk | contribs) | *Figure Caption: Two examples of images from an ESEM. Taken with a Philips XL-30 FEG. The first shows a electron beam deposited nanowire between two microelectrodes that has burnt after sustaining a high bias current. The other shows a multiwall carbon na |
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