File:Bringing Polymer Patterns into Focus (5940988602).jpg
Bringing_Polymer_Patterns_into_Focus_(5940988602).jpg (169 × 250 pixels, file size: 11 KB, MIME type: image/jpeg)
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Summary
[edit]DescriptionBringing Polymer Patterns into Focus (5940988602).jpg |
Working at the NIST Center for Neutron Research, chemical engineer Eric Lin places a semiconductor wafer in the path of a focused neutron beam. The beam is used to determine the size and shape of polymer patterns on the silicon wafer. Twenty-eight magnesium fluoride lenses focus the neutron beam so that the instrument can characterize polymer structures between 100-300 nanometers wide. This image may be used for any NIST purpose. Correct photo credit must be provided. Other organizations may use this image without charge for editorial articles that mention NIST in accompanying text or a caption. Correct photo credit must be provided. "Stock art" use requires permission and may require payment to the photographer. To receive a high resolution version send an email with the image AV number and title to inquiries@nist.gov. Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST. Use of NIST Information: These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology (NIST). With the exception of material marked as copyrighted, information presented on these pages is considered public information and may be distributed or copied. Use of appropriate byline/photo/image credits is requested. |
Date | |
Source | Bringing Polymer Patterns into Focus |
Author | National Institute of Standards and Technology |
Licensing
[edit]Public domainPublic domainfalsefalse |
This image is in the public domain in the United States because it is a work of the United States Federal Government, specifically an employee of the National Institute of Standards and Technology, under the terms of Title 17, Chapter 1, Section 105 of the US Code.
English ∙ 日本語 ∙ македонски ∙ Nederlands ∙ +/− |
This image was originally posted to Flickr by National Institute of Standards and Technology at https://flickr.com/photos/63059536@N06/5940988602. It was reviewed on 7 September 2016 by FlickreviewR and was confirmed to be licensed under the terms of the United States Government Work. |
7 September 2016
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current | 02:19, 7 September 2016 | 169 × 250 (11 KB) | Vanished Account Byeznhpyxeuztibuo (talk | contribs) | Transferred from Flickr via Flickr2Commons |
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