File:Atomic Force Microscopy (AFM) tip attached to a tuning fork.jpg

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English: This picture shows the tip assembly of an Atomic Force Microscope (AFM). A very fine tip is attached to one of the legs of a quartz tuning fork (bottom leg in the picture). The quartz tuning fork oscillates with its natural frequency. As the tip scans over a surface at a close range (distance between tip and surface ~ few nanometers), the natural frequency of oscillation of the tuning fork changes due to interaction of tip with atoms/molecules on the surface. By measuring these shift in the natural frequency of tuning fork oscillations as the tip scans over a surface, a topographic map of the surface with nanometer size resolutions can be made. This picture of AFM tip assembly was taken using a phone camera attached to a stereo microscope.
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Author Dinesh.dhankhar

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current18:40, 27 November 2019Thumbnail for version as of 18:40, 27 November 20192,152 × 1,571 (525 KB)Dinesh.dhankhar (talk | contribs)User created page with UploadWizard

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