File:Afmtipoverview.png
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Original file (1,536 × 1,103 pixels, file size: 1.24 MB, MIME type: image/png)
Captions
Captions
Scanning electron image of typical atomic force microscopy tip.
Summary[edit]
| Description |
English: This image shows a cantilever and tip for an atomic force microscope probe. The tip has a length of about 4 microns and a radius of curvature at the end of about 10nm. |
| Date | |
| Source | Own work |
| Author | NanoscaleRanger |
Licensing[edit]
I, the copyright holder of this work, hereby publish it under the following license:
This file is licensed under the Creative Commons Attribution-Share Alike 4.0 International license.
- You are free:
- to share – to copy, distribute and transmit the work
- to remix – to adapt the work
- Under the following conditions:
- attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
- share alike – If you remix, transform, or build upon the material, you must distribute your contributions under the same or compatible license as the original.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 20:45, 20 March 2019 | | 1,536 × 1,103 (1.24 MB) | NanoscaleRanger (talk | contribs) | User created page with UploadWizard |
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