File:Сканирующий зондовый микроскоп и шероховатость кварцевой пластины.jpg
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Русский: атомно-силовая микроскопия
сканирующий зондовый микроскоп наноэдьюкаторEnglish: We examine the rough surface of the sample using a nano eductor. Unlike a scanning tunneling microscope, both conductive and non-conductive surfaces can be examined with an atomic force microscope. |
| Date | |
| Source | Own work |
| Author | Дерепко Виолетта Николаевна |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
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| current | 21:17, 30 May 2020 | | 807 × 605 (242 KB) | Deremurka (talk | contribs) | Uploaded own work with UploadWizard |
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