File:Silicon growth defect angle mag 200x.png
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Silicon_growth_defect_angle_mag_200x.png (768 × 576 pixels, file size: 500 KB, MIME type: image/png)
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[edit]DescriptionSilicon growth defect angle mag 200x.png |
Title: Silicon growth defect interface, angle
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Date | 13 September 2005 (original upload date) |
Source | No machine-readable source provided. Own work assumed (based on copyright claims). |
Author | No machine-readable author provided. Twisp assumed (based on copyright claims). |
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[edit]Public domainPublic domainfalsefalse |
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I, the copyright holder of this work, release this work into the public domain. This applies worldwide. In some countries this may not be legally possible; if so: I grant anyone the right to use this work for any purpose, without any conditions, unless such conditions are required by law. |
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 00:32, 13 September 2005 | ![]() | 768 × 576 (500 KB) | Twisp (talk | contribs) | * Title: Silicon growth defect interface, angle * Desc: Image of growth defect interface in Si crystal made using interference microscope with 200x magnification. We can observe a defined angle on the interface. * Author: Twisp * Date: 24.08.2005 |
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