File:Rochester Community and Technical College Tour (7157844830).jpg

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John Suehle (left) of NIST’s Physical Measurement Laboratory’s Semiconductor and Dimensional Metrology Division explains research into the fabrication and characterization of nanoscale electronic devices to students and faculty from Rochester Community and Technical College in Rochester, MN.

Credit: NIST

Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST.

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These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology (NIST). With the exception of material marked as copyrighted, information presented on these pages is considered public information and may be distributed or copied. Use of appropriate byline/photo/image credits is requested.
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Source Rochester Community and Technical College Tour
Author National Institute of Standards and Technology

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This image is in the public domain in the United States because it is a work of the United States Federal Government, specifically an employee of the National Institute of Standards and Technology, under the terms of Title 17, Chapter 1, Section 105 of the US Code.

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This image was originally posted to Flickr by National Institute of Standards and Technology at https://flickr.com/photos/63059536@N06/7157844830. It was reviewed on 7 September 2016 by FlickreviewR and was confirmed to be licensed under the terms of the United States Government Work.

7 September 2016

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current01:47, 7 September 2016Thumbnail for version as of 01:47, 7 September 20161,024 × 1,143 (1.01 MB)Vanished Account Byeznhpyxeuztibuo (talk | contribs)Transferred from Flickr via Flickr2Commons

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