File:Nanoscope.jpg
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Size of this preview: 800 × 531 pixels. Other resolutions: 320 × 213 pixels | 640 × 425 pixels | 1,024 × 680 pixels | 1,280 × 850 pixels | 2,560 × 1,700 pixels | 4,288 × 2,848 pixels.
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| Description |
This instrument performs atomic force microscopy to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samples. (Pictured: Seth Darling, scientist in the Electronic & Magnetic Materials & Devices group.) The Center for Nanoscale Materials at Argonne National Laboratory is a joint partnership between the U.S. Department of Energy (DOE) and the State of Illinois, as part of DOE's Nanoscale Science Research Center program. |
| Date | |
| Source | Scanning probe microscope (Veeco Multimode with NanoScope V Controller) |
| Author | Matt Howard |
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This image, originally posted to Flickr, was reviewed on July 5, 2009 by the administrator or reviewer File Upload Bot (Magnus Manske), who confirmed that it was available on Flickr under the stated license on that date. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 15:02, 5 July 2009 | | 4,288 × 2,848 (6.6 MB) | File Upload Bot (Magnus Manske) (talk | contribs) | {{Information |Description= This instrument performs atomic force microscopy (AFM) to measure surface characteristics and imaging for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, among a multitude of other samp |
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