File:Amostra Van der Pauw.svg
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[edit]DescriptionAmostra Van der Pauw.svg |
English: Method to measure eletric resistivity in semiconductors materials - van der Pauw. Four-point probe technique
Português: Método para medida de resistividade elétrica em materiais semicondutores - van der Pauw. Esquemático para medições de quatro pontas. |
Date | 08 / 05/ 2015 |
Source | L. J. van der Pauw. A Method of measuring specific resistivity and Hall Effect of discs of arbitrary shape. Philips Res Repts, Vol 13, 1-9, February 1958 |
Author | Creator:Andersonbordin |
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current | 19:22, 8 May 2015 | 744 × 1,052 (11 KB) | Andersonbordin (talk | contribs) | {{Information |Description ={{en|1=Method to measure eletric resistivity in semiconductors materials - van der Pauw. Four-point probe technique}} {{pt|1=Método para medida de resistividade elétrica em materiais semicondutores - van der Pauw. Esque... |
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Width | 210mm |
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Height | 297mm |
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