File:AFMsetup.jpg
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AFMsetup.jpg (721 × 569 pixels, file size: 86 KB, MIME type: image/jpeg)
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[edit]DescriptionAFMsetup.jpg |
English: Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
Deutsch: Typischer Aufbau eines Rasterkraftmikroskops (RKM): Die Auslenkung eines Abtastarms (Englisch: Cantilever) mit einer feinen Tastspitze wird während des Abtastens der Oberfläche anhand der Auslenkung eines Laserstrahls bestimmt, der von der Oberseite des Abtastarms reflektiert wird. |
Date | 2013-10-13--202.160.164.205 09:49, 3 October 2013 (UTC)--202.160.164.205 09:49, 3 October 2013 (UTC) |
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Author | yashvant |
Permission (Reusing this file) |
CC-BY-2.5, please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration! |
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 14:10, 21 November 2006 | 721 × 569 (86 KB) | KristianMolhave (talk | contribs) | *Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made |
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