File:AFM LFM signal scan.jpg
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AFM_LFM_signal_scan.jpg (455 × 240 pixels, file size: 27 KB, MIME type: image/jpeg)
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[edit]Typical signal from a scan with the AFM in lateral force mode. At the turning points the tip sticks to the surface and the signal has a linear slope with the detector sensitivity. When the lateral tip-sample force exceeds the static friction force between the sample and substrate, the tip will start to slide with the dynamic friction force and s steady signal.
- This illustration was made for the Opensource Handbook of Nanoscience and Nanotechnology
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- The image also appears on the Commons/nanotechnology page
- Illustration by Kristian Molhave and released for free use provided you acknowledge using it from the Opensource Handbook of Nanoscience and Nanotechnology.
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 20:53, 19 November 2006 | ![]() | 455 × 240 (27 KB) | KristianMolhave (talk | contribs) | Typical signal from a scan with the AFM in lateral force mode. At the turning points the tip sticks to the surface and the signal has a linear slope with the detector sensitivity. When the lateral tip-sample force exceeds the static friction force between |
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