File:AFM-IR & s‑SNOM NT-MDT microscope.jpg

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Captions

Captions

IR s‑SNOM microscope

Summary

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Description
English: AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis.

Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies.

Such systems allows detection of near-field signal amplitude and phase.

Spatial resolution of IR s‑SNOM is about 10 nm and defined only by tip size.
Date
Source Own work
Author AAMonitor96

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